Optical Metrology Equipment

optical interferometer-based instrumentation:

wavelength meters, spectrum analyzers and thickness gauges

wavelength meters

Systems are available for CW and pulsed lasers that operate at wavelengths from 375 nm to 12 µm.

For pulsed and/or CW lasers
Wavelength accuracy as high as ± 0.2ppm (± 0.0002 nm at 1 μm)
Operation available from 375 nm to 2.5 μm
Fast sustained measurement rate up to 1 kHz

spectrum analyzers

Operates from 375 nm to 12 μm.
Spectral resolution up to 2 GHz,
Wavelength accuracy as high as ± 0.2 ppm
Optical rejection ratio of more than 40 dB

thickness gauges

Optical thickness gauges for development and production of optical components and lens assemblies, contact and intraocular lenses, displays (OLED, AMOLED, and LCD), medical products (balloon catheters, stents, bags, and tubing), semiconductors, and glass.
Analyze hard and soft materials without damage or deformation.
have the ability to measure the thickness of multiple layers simultaneously.
ideal for both laboratory and manufacturing environments

Wavelength Meters – Telecom

Single-wavelength measurement
Operation with CW and modulated signals
Fast measurement rate of 25 Hz
Wavelength accuracy as high as ± 0.3 pm

News:

772 SERIES LASER SPECTRUM ANALYZER

Spectral analysis of pulsed and CW lasers
Spectral resolution as high as 4 GHz
Wavelength accuracy of ± 10 parts per million
Optical rejection ratio as high as 20 dB
Operation available from 1 to 12 μm

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2021 © All rights Reserved to bi-pol Ltd

The site was built and developed in ❤ by Media-Master