Optical Metrology Equipment

optical interferometer-based instrumentation:

wavelength meters, spectrum analyzers and thickness gauges

wavelength meters

Systems are available for CW and pulsed lasers that operate at wavelengths from 375 nm to 12 µm.

  • For pulsed and/or CW lasers
  • Wavelength accuracy as high as ± 0.2ppm (± 0.0002 nm at 1 μm)
  • Operation available from 375 nm to 2.5 μm
  • Fast sustained measurement rate up to 1 kHz


spectrum analyzers

  • Operates from 375 nm to 12 μm.
  • Spectral resolution up to 2 GHz,
  • Wavelength accuracy as high as ± 0.2 ppm
  • Optical rejection ratio of more than 40 dB

thickness gauges

  • Optical thickness gauges for  development and production of optical components and lens assemblies, contact and intraocular lenses, displays (OLED, AMOLED, and LCD), medical products (balloon catheters, stents, bags, and tubing), semiconductors, and glass.
  • Analyze hard and soft materials without damage or deformation. 
  • have the ability to measure the thickness of multiple layers simultaneously.
  •  ideal for both laboratory and manufacturing environments

Wavelength Meters – Telecom

  • Single-wavelength measurement
  • Operation with CW and modulated signals
  • Fast measurement rate of 25 Hz
  • Wavelength accuracy as high as ± 0.3 pm


  • Spectral analysis of pulsed and CW lasers
  • Spectral resolution as high as 4 GHz
  • Wavelength accuracy of ± 10 parts per million
  • Optical rejection ratio as high as 20 dB
  • Operation available from 1 to 12 μm

Related Products

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